Keyword

defect isolation

Description: Defect isolation is the process of locating and distinguishing faults in electronic devices or integrated circuits for testing and troubleshooting.

Primary topic: Integrated Circuits and Semiconductor Failure Analysis (48%)

OpenAlex ID: keywords/defect-isolation

Molecular Sieving Across Centimeter-Scale Single-Layer Nanoporous Graphene Membranes

2017 · Michael S. H. Boutilier, Doojoon Jang, et al. · ACS Nano · 140

Guided-wave signal processing using chirplet matching pursuits and mode correlation for structural health monitoring

2007 · Ajay Raghavan, Carlos E S Cesnik · Smart Materials and Structures · 136

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Scalable and Deterministic Fabrication of Quantum Emitter Arrays from Hexagonal Boron Nitride

2021 · Chi Li, Noah Mendelson, et al. · Nano Letters · 89

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Controlled Sulfurization Process for the Synthesis of Large Area MoS2 Films and MoS2/WS2 Heterostructures

2015 · Daniele Chiappe, Inge Asselberghs, et al. · Advanced Materials Interfaces · 71

Origin of Yellow-Band Emission in Epitaxially Grown GaN Nanowire Arrays

2014 · Baodan Liu, Fang Yuan, et al. · ACS Applied Materials & Interfaces · 60

Isolation of ultrasonic scattering by wavefield baseline subtraction

2015 · Alexander J. Dawson, Jennifer E. Michaels, et al. · Mechanical Systems and Signal Processing · 53

Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization

2018 · Steven P. Harvey, John Moseley, et al. · Progress in Photovoltaics Research and Applications · 33

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Defect-Tolerant TiO2-Coated and Discretized Photoanodes for >600 h of Stable Photoelectrochemical Water Oxidation

2020 · Xin Shen, Maoqing Yao, et al. · ACS Energy Letters · 32

Influence of local shunting on the electrical performance in industrial Silicon solar cells

2016 · P. Somasundaran, R. Gupta · Solar Energy · 22

Fault Localization in Contact Level by Using Conductive Atomic Force Microscopy

2003 · Jon C. Lee, J. H. Chuang · Proceedings - International Symposium for Testing and Failure Analysis · 20

Defect Diagnostic Matrix -a Defect Learning Vehicle For Submicron Technologies

2005 · R.E. Newhart, E.J. Sprogis · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 19

Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation

2002 · Jon C. Lee, C.H. Chen, et al. · Microelectronics Reliability · 17

Finding fault with deep-submicron ICs

1997 · D.P. Vallett, J.M. Soden · IEEE Spectrum · 17

Erasing Core Boundaries for Robust and Configurable Performance

2010 · Shantanu Gupta, Shuguang Feng, et al. · Proceedings of the ... annual International Symposium on Microarchitecture/Proceedings of the annual International Symposium on Microarchitecture · 16

Detection and Root Cause Analysis of Memory-Related Software Aging Defects by Automated Tests

2013 · Felix Langner, Artur Andrzejak · IEEE International Symposium on Modelling, Analysis and Simulation of Computer and Telecommunication Systems (MASCOTS) · 14

A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization

2003 · Michael Ruprecht, Guenther Benstetter, et al. · Microelectronics Reliability · 14

GaAs Microisland Anodes Protected by Amorphous TiO2 Films Mitigate Corrosion Spreading During Water Oxidation in Alkaline Electrolytes

2021 · Pakpoom Buabthong, Jake M. Evans, et al. · ACS Energy Letters · 13

Corrosive behavior of chromium carbide-based films formed on steel using a filtered cathodic vacuum arc system

2006 · Chun-Chun Lin, Ku-Ling Chang, et al. · Applied Surface Science · 13

Isolating failing sites in IC packages using time domain reflectometry: Case studies

2005 · D. Abessolo-Bidzo, P. Poirier, et al. · Microelectronics Reliability · 13

Microelectronic test structures for rapid automated contactless inline defect inspection

1997 · A.V.S. Satya · IEEE Transactions on Semiconductor Manufacturing · 12

Control on the density and optical properties of color centers at SiO2/SiC interfaces by oxidation and annealing

2023 · Takato Nakanuma, Kosuke Tahara, et al. · Applied Physics Letters · 11