Keyword

depth profiling

Description: A surface-analysis technique for measuring the composition or properties of a material at successive depths beneath its surface.

Primary topic: Ion-surface interactions and analysis (29%)

OpenAlex ID: keywords/depth-profiling

Electron Spectroscopy Studies on Magneto-Optical Media and Plastic Substrate Interface

1987 · T. Yorozu, M. Hirano, et al. · IEEE Translation Journal on Magnetics in Japan · 3,692

X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

2000 · M Chen, X Wang, et al. · Applied Surface Science · 1,316

Secondary Ion Mass Spectrometry

1993 · Analytica Chimica Acta · 1,137

Thin Film Analysis by X‐Ray Scattering

2005 · Mario Birkholz · Wiley eBooks · 1,022

A Practical Model for Organic Richness from Porosity and Resistivity Logs

1990 · Q. R. Passey, S. Creaney, et al. · AAPG Bulletin · 1,008

Surface Analysis – The Principal Techniques

2009 · Wiley eBooks · 1,000

Photoacoustics and Photoacoustic Spectroscopy

1981 · A. Rosencwaig, Peter R. Griffiths · Physics Today · 941

Zircon Hf-isotope analysis with an excimer laser, depth profiling, ablation of complex geometries, and concomitant age estimation

2004 · Jon Woodhead, Janet Hergt, et al. · Chemical Geology · 918

The cathode–electrolyte interface in the Li-ion battery

2004 · K. Edström, T. Gustafsson, et al. · Electrochimica Acta · 906

The Electrical Characterization of Semiconductors: Majority Carriers and Electron States

1992 · P. Blood, John Orton · Medical Entomology and Zoology · 841

Study of polycrystalline Cu2ZnSnS4 films by Raman scattering

2011 · P.A. Fernandes, P.M.P. Salomé, et al. · Journal of Alloys and Compounds · 693

Characterization of Iron Oxides Commonly Formed as Corrosion Products on Steel

1998 · Sei J. Oh, D.C. Cook, et al. · Hyperfine Interactions · 683

Electron Spectroscopy of Aqueous Solution Interfaces Reveals Surface Enhancement of Halides

2005 · Sutapa Ghosal, John C. Hemminger, et al. · Science · 665

Ion beam crystallography of surfaces and interfaces

1985 · J.F. van der Veen · Surface Science Reports · 602

The depth resolution of sputter profiling

1979 · H. H. Andersen · Applied Physics A · 595

Quantitative multi-element analysis of minerals, fluid and melt inclusions by laser-ablation inductively-coupled-plasma mass-spectrometry

2003 · C.A. Heinrich, T. Pettke, et al. · Geochimica et Cosmochimica Acta · 581

Auger and X-ray Photoelectron Spectroscopy

1990 · D. Briggs, M. P. Seah · Medical Entomology and Zoology · 507

The ChemCam Instrument Suite on the Mars Science Laboratory (MSL) Rover: Science Objectives and Mast Unit Description

2012 · S. Maurice, R. C. Wiens, et al. · Space Science Reviews · 485

The probing depth in photoemission and auger-electron spectroscopy

1974 · I. Lindau, W.E. Spicer · Journal of Electron Spectroscopy and Related Phenomena · 477

Surface characterization of carbon fibers using angle-resolved XPS and ISS

1995 · Steven D. Gardner, Chakravarthy S.K. Singamsetty, et al. · Carbon · 472

Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis

1989 · Robert G. Wilson, F. A. Stevie, et al. · Medical Entomology and Zoology · 462

Dynamic formation of a solid-liquid electrolyte interphase and its consequences for hybrid-battery concepts

2016 · Martin R. Busche, Thomas Drossel, et al. · Nature Chemistry · 453

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1973 · A. Benninghoven · Surface Science · 452

FIB damage of Cu and possible consequences for miniaturized mechanical tests

2007 · D. Kiener, C. Motz, et al. · Materials Science and Engineering A · 451

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

1971 · G. Amsel, J.P. Nadai, et al. · Nuclear Instruments and Methods · 441

Works count: 11,300

Citation count: 182,700