Keyword

ESD damage

Description: Physical or functional harm to electronic devices or components caused by electrostatic discharge.
OpenAlex ID: keywords/esd-damage
1990 · G. Theodore Dangelmayer · Springer eBooks · 256
1992 · Ajith Amerasekera, Jan Verwey · Quality and Reliability Engineering International · 44
1997 · Albert J. Wallash, Young K. Kim · Journal of Applied Physics · 39
1987 · G. Krieger · IEEE Transactions on Electron Devices · 38
1981 · B. A. Unger · IEEE International Reliability Physics Symposium proceedings · 35
1996 · A.J. Wallash · IEEE Transactions on Magnetics · 27
2005 · Jaakko Paasi · Journal of Electrostatics · 24
2004 · M.N.O. Sadiku, C.M. Akujuobi · IEEE Potentials · 24
2006 · A. Cester, S. Gerardin, et al. · IEEE Transactions on Device and Materials Reliability · 19
2003 · C. Duvvury, R.N. Rountree, et al. · 17
1984 · William D. Greason, G. S. Peter Castle · IEEE Transactions on Industry Applications · 17
2009 · Bastian Arndt, Friedrich zur Nieden, et al. · International Zurich Symposium on Electromagnetic Compatibility (EMC Zurich) · 15
1996 · J. Himle · IEEE Transactions on Magnetics · 15
2003 · Theo Smedes, Y. Li · Electrical Overstress/Electrostatic Discharge Symposium · 14
2000 · A. Wallash, J. Hillman, et al. · IEEE Transactions on Magnetics · 14
2013 · Ya-Hsiang Tai, Hao-Lin Chiu, et al. · Journal of Display Technology · 13
2007 · Reinhold Gaertner · Electrical Overstress/Electrostatic Discharge Symposium · 12
2002 · L. Baril, Tim Cheung, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2018 · Darwin Zhang Li, Shubhankar Marathe, et al. · IEEE Transactions on Electromagnetic Compatibility · 11
1999 · D. Pogany, N. Seliger, et al. · Microelectronics Reliability · 11
2013 · Kuo-Hsuan Meng, Elyse Rosenbaum · IEEE Transactions on Device and Materials Reliability · 10
2002 · D.C. Smith, E. Nakauchi · Electrical Overstress/Electrostatic Discharge Symposium · 10
Works count: 238
Citation count: 1,009
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