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Keyword

semiconductor device testing

Description: The measurement and evaluation of semiconductor devices to determine whether they meet electrical, functional, or reliability requirements.
OpenAlex ID: keywords/semiconductor-device-testing
The reliability of semiconductor devices in the bell system
1974 · D.S. Peck, C.H. Zierdt · Proceedings of the IEEE · 105
New capabilities of OBIRCH method for fault localization and defect detection
2002 · K. Nikawa, S. Inoue · Proceedings - Asian Test Symposium/Proceedings · 64
On Steepest-Descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations
2008 · A. De Cezaro, M. Haltmeier, et al. · Applied Mathematics and Computation · 53
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Characterization Methods for Submicron MOSFETs
1995 · Kluwer international series in engineering and computer science · 34
Automatic, wafer-level, low frequency noise measurements for the interface slow trap density evaluation
2003 · J.A. Chroboczek · International Conference on Microelectronic Test Structures · 31
Electron‐beam test system for high‐speed devices
1987 · M. Brunner, D. Winkler, et al. · Scanning · 26
Scheduling semiconductor device test operations on multihead testers
1999 · T. Freed, R.C. Leachman · IEEE Transactions on Semiconductor Manufacturing · 21
Helium leak detectors: from a laboratory device to dedicated industrial leak test units
1993 · Werner Große Bley · Vacuum · 21
Defect localization using photon emission microscopy analysis with the combination of OBIRCH analysis
2010 · Wu Chunlei, Linda Zhai, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 19
In-house development of scheduling decision support systems: case study for scheduling semiconductor device test operations
2006 · T. Freed, K. H. Doerr, et al. · International Journal of Production Research · 18
Visible Light LVP on Bulk Silicon Devices
2015 · Joshua Beutler, V. Carter Hodges, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 16
Diffractive lenses for high resolution laser based failure analysis
2006 · Frank Zachariasse, Martijn Goossens · International Symposium on the Physical and Failure Analysis of Integrated Circuits · 14
Failure Analysis From Back Side of Die
1996 · N.M. Wu, K. Weaver, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 14
New Laser-Scan Exposure System for Delineating Precise Helical Patterns onto Sub-50-µm Wires
2012 · Toshiyuki Horiuchi, Ryosuke Sasaki · Japanese Journal of Applied Physics · 13
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New Method of Screening Out Outlier; Expanded Part Average Testing During Package Level Test
2017 · Tadashi Sakamoto, Kazunori Yofu, et al. · IEEE Transactions on Semiconductor Manufacturing · 10
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG)
2006 · B. Eklow, B. Bennetts · Proceedings/Proceedings - European Test Workshop · 10
Improved I/sub DDQ/ testing with empirical linear prediction
2003 · D.I. Bergman, H. Engler · Proceedings/Proceedings - International Test Conference · 10
Circular test structures for determining the specific contact resistance of ohmic contacts
2017 · Anthony Holland, Yue Pan, et al. · Facta universitatis - series Electronics and Energetics · 8
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Electron Beam Absorbed Current as a Means of Locating Metal Defectivity on 45nm SOI Technology
2010 · K. Dickson, G. Lange, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 8
Optimizing Pulsed OBIC Technique for ESD Defect Localization
2007 · Fabien Essely, Nicolas Guitard, et al. · IEEE Transactions on Device and Materials Reliability · 8
Advanced Production Testing of RF, SoC, and SiP Devices
2006 · Joseph J. Kelly, Michael Engelhardt · 8
Good scan = good quality level? Well, it depends
2003 · A.K. Vij · Proceedings/Proceedings - International Test Conference · 8
Automatic data acquisition system for semiconductor device testing
1967 · Univ. of Missouri, Rolla, MO (United States), Donald Bartling, et al. · 8
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2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)
2013 · 7
Fully automated semiconductor operating condition testing
2006 · Thomas Nirmaier, Wolfgang Spirkl, et al. · Proceedings/Proceedings - International Test Conference · 7
Works count: 458
Citation count: 856
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