Source

Characterization of Materials

Source type: journal

Publisher:

Fully OA: No

DOAJ: No

OpenAlex ID: S2764800673

Scanning Electrochemical Microscopy

2012 · Shigeru Amemiya · Characterization of Materials · 95

Scanning Electrochemical Microscopy

2002 · David O. Wipf · Characterization of Materials · 90

Electron Paramagnetic Resonance

2012 · Gareth R. Eaton, Sandra S. Eaton · Characterization of Materials · 88

Scanning Electron Microscopy

2012 · Donovan N. Leonard, Gary W. Chandler, et al. · Characterization of Materials · 62

Porosity and Its Measurement

2012 · Laura Espinal · Characterization of Materials · 61

Reflection High‐Energy Electron Diffraction

2012 · Shuji Hasegawa · Characterization of Materials · 60

Fourier Transform Infrared ( FTIR ) Spectroscopy

2012 · Jeffrey S. Gaffney, Nancy A. Marley, et al. · Characterization of Materials · 43

Particle‐Induced X‐Ray Emission

2002 · John L. Campbell · Characterization of Materials · 41

Impedance Spectroscopy of Dielectrics and Electronic Conductors

2012 · Nikolaos Bonanos, Polycarpos Pissis, et al. · Characterization of Materials · 38

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Ultraviolet and Visible Absorption Spectroscopy

2012 · Brian M. Tissue · Characterization of Materials · 36

High‐Strain‐Rate Testing of Materials: The Split‐Hopkinson Pressure Bar

2012 · George T. (Rusty) Gray · Characterization of Materials · 36

Secondary Ion Mass Spectrometry

2012 · John F. Watts, John Wolstenholme, et al. · Characterization of Materials · 35

Pair Distribution Functions Analysis

2012 · Valeri Petkov · Characterization of Materials · 34

Electrochemical Impedance Spectroscopy

2012 · Yevgen Barsukov, J. Ross Macdonald · Characterization of Materials · 34

Mössbauer Spectrometry

2012 · Brent Fultz · Characterization of Materials · 33

Transmission Electron Microscopy

2012 · James M. Howe, Brent Fultz, et al. · Characterization of Materials · 31

Potentiostatic and Galvanostatic Intermittent Titration Techniques

2012 · Mikhael D. Levi, Doron Aurbach · Characterization of Materials · 29

Low‐Energy Ion Scattering

2012 · Hidde H. Brongersma · Characterization of Materials · 26

Thermogravimetric Analysis

2012 · Sergey Vyazovkin · Characterization of Materials · 26

Computation of Diffuse Intensities in Alloys

2002 · Duane D. Johnson, Frank J. Pinski, et al. · Characterization of Materials · 25

Deep Level Transient Spectroscopy

2012 · Chin‐Che Tin · Characterization of Materials · 24

Differential Scanning Calorimetry and Differential Thermal Analysis

2012 · Christoph Schick, Dusan Lexa, et al. · Characterization of Materials · 23

Hall Effect and Conductivity Measurements in Semiconductor Crystals and Thin Films

2012 · Klaus Ellmer · Characterization of Materials · 23

Positron Annihilation Studies of Materials

2012 · David J. Keeble, U. Brossmann, et al. · Characterization of Materials · 23

Hall Effect in Semiconductors

2002 · David Look · Characterization of Materials · 22

Works count: 269

Citation count: 1,688

H-index: 23

I10-index: 43

2yr mean citedness: