Work

Scanning Electron Microscopy

Year: 2012

Type: other

Source: Characterization of Materials

DOI: 10.1002/0471266965.com081.pub2

Authors: Donovan N. Leonard, Gary W. Chandler, Supapan Seraphin

Institutions: Oak Ridge National Laboratory, University of Arizona

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Oak Ridge National Laboratory

OpenAlex ID: W1902829218

Cites: 23

Cited by: 62

Related to: 10