Year: 2009
Type: conference-paper
Abstract: Multicrystalline silicon wafers used for solar cells exhibit defect clusters-localized crystal defects in and near grains of some specific orientations. Defect clusters are also dominant sites for impurity precipitation, and they remain ungettered and unpassivated through the solar cell processing. This paper describes characteristics of defect clusters, and shows, through theory and experiment, that defect clusters typically lower cell efficiency by 3 to 4 absolute percentage points. To recover this efficiency loss, it is necessary to getter precipitated impurities.
Source: ECS Transactions
DOI: 10.1149/1.3096571
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1323633