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Michael R. Seacrist

Observed names: M Seacrist, M. R. Seacrist, M. Seacrist, MR Seacrist, Michael Seacrist, Seacrist, M.
OpenAlex ID: A5111411031
Silicon Crystal Growth and Wafer Technologies
2012 · G. Fisher, M. R. Seacrist, et al. · Proceedings of the IEEE · 147
Nickel solubility in intrinsic and doped silicon
2004 · A. A. Istratov, P. Zhang, et al. · Journal of Applied Physics · 59
Chemical Interaction-Guided, Metal-Free Growth of Large-Area Hexagonal Boron Nitride on Silicon-Based Substrates
2017 · Sanjay Behura, Phong Nguyen, et al. · ACS Nano · 47
WS2\/Silicon Heterojunction Solar Cells: A CVD Process for the Fabrication of WS2 Films on p-Si Substrates for Photovoltaic and Spectral Responses
2017 · Sanjay Behura, Kai-Chih Chang, et al. · IEEE Nanotechnology Magazine · 28
Performance Limitations of mc-Si Solar Cells Caused by Defect Clusters
2009 · Bhushan Sopori, P. Rupnowski, et al. · ECS Transactions · 26
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On the scalability of source/drain current enhancement in thin film sSOI
2005 · E. Augendre, G. Eneman, et al. · European Solid-State Device Research Conference · 23
Intergrain Diffusion of Carbon Radical for Wafer-Scale, Direct Growth of Graphene on Silicon-Based Dielectrics
2018 · Phong Nguyen, Sanjay K. Behura, et al. · ACS Applied Materials & Interfaces · 13
Current transport characteristics across shallow hybrid-orientation silicon bonded interfaces
2007 · M. C. Wagener, R. H. Zhang, et al. · Applied Physics Letters · 13
Unusual $C$– $V$ Characteristics of High-Resistivity SOI Wafers
2011 · P. Nayak, M. Seacrist, et al. · IEEE Electron Device Letters · 11
PMOSFET Reliability Study for Direct Silicon Bond (DSB) Hybrid Orientation Technology (HOT)
2007 · Yao-Tsung Huang, A. Pinto, et al. · IEEE Electron Device Letters · 7
Influence of defects and defect distributions in multicrystalline silicon on solar cell performance
2010 · B. Sopori, P. Rupnowski, et al. · Conference record of the IEEE Photovoltaic Specialists Conference · 6
Effects of high-temperature anneals and Co60 gamma-ray irradiation on strained silicon on insulator
2007 · K. Park, M. Canonico, et al. · Journal of Applied Physics · 5
EBIC characterization of strained Si/SiGe heterostructures
2007 · E. B. Yakimov, R. H. Zhang, et al. · Semiconductors · 5
Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces
2007 · Magnus C. Wagener, R.H. Zhang, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 4
High Quality, Low Cost Bulk Gallium Nitride Substrates Grown by the Electrochemical Solution Growth Method
2017 · Michael Seacrist, USDOE Office of Energy Efficiency and Renewable Energy (EERE), Advanced Manufacturing Office (EE-5A) · 2
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Si Wafer Bonding: Structural Features of the Interface
2009 · V.I. Vdovin, N.D. Zakharov, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2
Sandwich stacks replacing SiO2 in standard bonded Si-on-Insulator (SOI) substrates to obtain a high-thermal conductivity HTC-SOI substrate
2008 · K. Van Wichelen, M. Schaekers, et al. · IEEE International SOI Conference (SOI) · 2
Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substrates
2008 · N. Kelaidis, V. Ioannou-Sougleridis, et al. · Thin Solid Films · 2
Application of Gate Oxide Integrity Measurements in Silicon Wafer Manufacturing
2000 · MR Seacrist · 2
Defect generation and propagation in mc-Si ingots: Influence on cell-to-cell performance variation
2011 · B. Sopori, P. Rupnowski, et al. · Conference record of the IEEE Photovoltaic Specialists Conference · 1
Influence of thermal oxidation on the interfacial properties of ultrathin strained silicon layers
2011 · V. Ioannou-Sougleridis, N. Kelaidis, et al. · Thin Solid Films · 1
Study of interfacial defects induced during the oxidation of ultrathin strained silicon layers
2009 · V. Ioannou-Sougleridis, N. Kelaidis, et al. · Journal of Applied Physics · 1
Silicon Epitaxial Layers for CCD and CMOS Imager Sensors : Limits and Challenges of the In-Line and Off-Line Metal Detection Techniques
2007 · G. Borionetti, S. Cox, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1
Silicon Epitaxial Layers for CCD and CMOS Imager Sensors : Limits and Challenges of the In-Line and Off-Line Metal Detection Techniques
2007 · G. Borionetti, S. Cox, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1
Junction Passivation for Direct Silicon Bond Hybrid Orientation Technology
2007 · S. Joshi, A. Pinto, et al. · IEEE Transactions on Electron Devices · 1
Works count: 35
Citation count: 411
H-index: 9
I10-index: 9
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