Work

An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch

Year: 2002

Type: article

Source: Journal of Electronic Testing

DOI: 10.1023/a:1016549725661

Authors: Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury, Sudipta Bhawmik

Institutions: Princeton University, Indian Institute of Technology Kharagpur

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1516699400

FWCI: 1.181

Cites: 10

Cited by: 9

Related to: 10