Work

Issues concerning CDM ESD verification modules-the need to move to alumina

Year: 2003

Type: conference-paper

Source: Electrical Overstress/Electrostatic Discharge Symposium

DOI: 10.1109/eosesd.1999.819006

Authors: L.G. Henry, M.A. Kelly, T. Diep, J. Barth

Institutions: Aptiv (United States), Texas Instruments (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1588692016

FWCI: 0.432

Cites: 6

Cited by: 12

Related to: 10