Author

Leo G. Henry

2001 · J.E. Barth, K. Verhaege, et al. · IEEE Transactions on Electronics Packaging Manufacturing · 190
2002 · J. Barth, K. Verhaege, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 52
2003 · Steven H. Voldman, R.A. Ashton, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 29
2003 · M. Kelly, L.G. Henry, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 23
2002 · D. Lin, D. Pommerenke, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 20
2002 · L.G. Henry, M.A. Kelly, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 16
1998 · M. Chaine, K. Verhaege, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 14
2006 · L. Henry, Ravindra Narayan, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2005 · L.G. Henry, H. Hyatt, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2003 · L.G. Henry, M.A. Kelly, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2021 · Patricia Bouyer, Léo Henry, et al. · International Journal on Software Tools for Technology Transfer · 9
1988 · J. Lachter, L. G. Henry, et al. · Journal of Applied Crystallography · 9
2006 · Chaine, M., Meuse, T., et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 7
2004 · Jon Barth, John Richner, et al. · Journal of Electrostatics · 7
2000 · Leo G. Henry, Jon Barth, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 7
2018 · Léo Henry, Thierry Jéron, et al. · Lecture notes in computer science · 6
2002 · Jon Barth, John Richner, et al. · 6
1998 · L.G. Henry, T. Raymond, et al. · Microelectronics Reliability · 6
2023 · Tiago Ferreira, Léo Henry, et al. · Electronic Proceedings in Theoretical Computer Science · 5
1986 · Jalil Lachter, Leo G. Henry, et al. · Journal of materials research/Pratt's guide to venture capital sources · 5
2008 · Muhonen, Ashton, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 4
2002 · Leo G. Henry, Jon Barth, et al. · Microelectronics Reliability · 4
2003 · L.G. Henry, B.J. Hall · Electrical Overstress/Electrostatic Discharge Symposium · 3
1999 · M Chaine, K Verhaege, et al. · Microelectronics Reliability · 3
1998 · Leo G. Henry, J.H. Mazur · Proceedings - International Symposium for Testing and Failure Analysis · 3
Works count: 48
Citation count: 475
H-index: 10
I10-index: 10
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