Work

Investigation into socketed CDM (SDM) tester parasitics

Year: 1999

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(99)00081-5

Authors: M Chaine, K Verhaege, L Avery, M Kelly, H Gieser, K Bock, L.G Henry, T Meuse, T Brodbeck, J Barth

Institutions: Micron (United States), Fraunhofer-Gesellschaft, IMEC, Infineon Technologies (Germany)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2034880418

FWCI: 0.444

Cites: 9

Cited by: 3

Related to: 10