Work

28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation

Year: 2015

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2015.7112761

Authors: P. Mora, X. Federspiel, F. Cacho, V. Huard, W. Arfaoui

Institution: STMicroelectronics (France)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1596944167

FWCI: 3.33

Cites:

Cited by: 10

Related to: 10