Work

Fast Fault Simulation to Identify Subcircuits Involving Faulty Components

Year: 2016

Type: conference-paper

Source: Mathematics in industry

DOI: 10.1007/978-3-319-23413-7_49

Authors: B. Tasić, J. J. Dohmen, E. J. W. ter Maten, T. G. J. Beelen, H. H. J. M. Janssen, W. H. A. Schilders, M. Günther

Institutions: NXP (Netherlands), NXP (Germany), University of Wuppertal, Eindhoven University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1768536601

FWCI:

Cites: 14

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Related to: 10