Work

Application and analysis of IDDQ diagnostic software

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.1997.639633

Authors: P. Nigh, D. Forlenza, F. Motika

Institutions: IBM (United States), Mirus Bio (United States), HopeLab, Mizuno Corporation (Japan)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1833973233

FWCI: 5.016

Cites: 27

Cited by: 42

Related to: 10