Work

Mixed-signal test

Year: 2002

Type: conference-paper

Source: International Conference on VLSI Design

DOI: 10.1109/icvd.1998.646619

Authors: A.K. Majhi, V.D. Agrawal

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1850320327

FWCI: 1.204

Cites: 23

Cited by: 13

Related to: 10