Work

A comprehensive examination of neural network architectures for analog fault diagnosis

Year: 2002

Type: conference-paper

Source: International Joint Conference on Neural Networks (IJCNN)

DOI: 10.1109/ijcnn.2001.938528

Authors: M. Aminian, F. Aminian

Institutions: St. Mary's University, Texas, Trinity University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1864084232

FWCI: 0.201

Cites: 6

Cited by: 12

Related to: 10