Suppression of ion-induced charge collection against soft-error
Year: 2002
Type: conference-paper
Authors: T. Kishimoto, N. Takai, Y. Ohno, H. Sayama, T. Nishimura
Institutions: The University of Osaka, Mitsubishi Electric (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1870909331