Work

Yield Projection Based on Electrical Fault Distribution and Critical Structure Analysis

Year: 1989

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-1-4615-6799-8_11

Authors: P. Schvan, D. Y. Montuno, R. Hadaway

Institutions: Nortel (Canada), Bell (Canada)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W19359244

FWCI: 1.123

Cites: 11

Cited by: 12

Related to: 10