Work

Automatic BIST design tool for mixed-signal circuits

Year: 2002

Type: conference-paper

Source: IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference)

DOI: 10.1109/autest.1998.713427

Authors: Chujen Lin, L. Haynes, P. Mandava, P. Prasad

Institutions: Intelligent Automation (United States), United States Army, U.S. Army Communications-Electronics Command

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1961995172

FWCI: 0.401

Cites: 2

Cited by: 5

Related to: 10