Study of RF N− LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF
Year: 2005
Type: article
Source: Microelectronics Reliability
Authors: H. Maanane, M. Masmoudi, J. Marcon, M.A. Belaid, K. Mourgues, C. Tolant, K. Ketata, Ph. Eudeline
Institution: Université de Rouen Normandie
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Région Normandie
OpenAlex ID: W1966088032