Work

Linear integrated circuit cumulated dose test representativeness for high energy electron environment applications

Year: 2013

Type: conference-paper

Source: European Conference on Radiation and Its Effects on Components and Systems

DOI: 10.1109/radecs.2013.6937396

Authors: N. Sukhaseum, A. Samaras, J-P. Abadie, B. Renaud, N. Chatry, F. Bezerra, E. Lorfevre, R. Ecoffet

Institution: Centre National d'Études Spatiales

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1967537005

FWCI: 0.812

Cites: 4

Cited by: 2

Related to: 10