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E. Lorfevre

Physical Model for the Low-Dose-Rate Effect in Bipolar Devices
2006 · J. Boch, F. Saigne, et al. · IEEE Transactions on Nuclear Science · 75
Online dosimetry based on optically stimulated luminescence materials
2005 · J.-R. Vaille, F. Ravotti, et al. · IEEE Transactions on Nuclear Science · 21
Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes
2018 · M. Mauguet, D. Lagarde, et al. · IEEE Transactions on Nuclear Science · 14
Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa
2014 · F. Wrobel, A. D. Touboul, et al. · IEEE Transactions on Nuclear Science · 12
Effect of Ion Energy on Power MOSFET's Oxide Reliability
2012 · M. Naceur, A. D. Touboul, et al. · IEEE Transactions on Nuclear Science · 10
Investigation of single event burnout sensitive depth in power MOSFETS
2009 · F. Darracq, V. Pouget, et al. · European Conference on Radiation and Its Effects on Components and Systems · 10
Dose Rate Switching Technique onELDRS-Free Bipolar Devices
2016 · J. Boch, A. Michez, et al. · IEEE Transactions on Nuclear Science · 9
On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination
2014 · A. Privat, A. D. Touboul, et al. · IEEE Transactions on Nuclear Science · 9
Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation
2013 · A. Privat, A. D. Touboul, et al. · IEEE Transactions on Nuclear Science · 7
Unfolding JASON-2/ICARE-NG high energy particles measurements using a Singular Value Decomposition approach
2013 · V. Maget, S. Bourdarie, et al. · European Conference on Radiation and Its Effects on Components and Systems · 4
ELDRS: Optimization Tools for the Switched Dose Rate Technique
2011 · J. Boch, Y. Gonzalez Velo, et al. · IEEE Transactions on Nuclear Science · 4
TCAD prediction of dose effects on MOSFETs with ECORCE
2017 · A. Michez, J. Boch, et al. · European Conference on Radiation and Its Effects on Components and Systems · 3
TCAD simulations of leakage currents induced by SDRAM single-event cell degradation
2016 · A. Rodriguez, F. Wrobel, et al. · European Conference on Radiation and Its Effects on Components and Systems · 3
Linear integrated circuit cumulated dose test representativeness for high energy electron environment applications
2013 · N. Sukhaseum, A. Samaras, et al. · European Conference on Radiation and Its Effects on Components and Systems · 2
SEB occurrence in a VIP: influence of the epi-substrate junction
2002 · E. Lorfevre, C. Sudre, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
SEU sensitive depth in a submicron SRAM technology
2002 · C. Detcheverry, R. Ecoffet, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
Works count: 16
Citation count: 185
H-index: 8
I10-index: 6
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