Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET
Year: 2004
Type: article
Source: Microelectronics Reliability
Authors: Shyue Seng Tan, Tu Pei Chen, Chew Hoe Ang, Lap Chan
Institution: Nanyang Technological University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1967763577