Work

A reliability lab-on-chip using programmable arrays

Year: 2014

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2014.6861123

Authors: Petr Pfeifer, Ben Kaczer, Zdenek Pliva

Institutions: Technical University of Liberec, IMEC

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1968665015

FWCI:

Cites: 14

Cited by: 3

Related to: 10