Work

Permittivity enhancement of aluminum oxide thin films with the addition of silver nanoparticles

Year: 2006

Type: article

Abstract: Multilayer reactive electron-beam evaporation of thin aluminum oxide layers with embedded silver nanoparticles (Ag-nps) has been used to create a dielectric thin film with an enhanced permittivity. The results show a frequency dependent increase of the dielectric constant κ. Overall stack κ of the control sample was found to be 7.7–7.4 in the 1kHz–1MHz range. This is in comparison with κ=16.7–13.0 over the same frequency range in the sample with Ag-nps. Capacitance-voltage and conductance-voltage measurements indicate the presence of charge capture resulting from the Ag-nps. The authors attribute this dielectric constant enhancement to dipole and space charge polarization mechanisms.

Source: Applied Physics Letters

DOI: 10.1063/1.2425010

Authors: R. Ravindran, K. Gangopadhyay, S. Gangopadhyay, N. Mehta, N. Biswas

Institutions: University of Missouri, Texas Instruments (United States), North Carolina State University

Language: English

Topic: Dielectric materials and actuators

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1970117005

FWCI: 2.362

Cites: 19

Cited by: 54

Related to: 10