Work

Energy-Efficient and Metastability-Immune Timing-Error Detection and Instruction-Replay-Based Recovery Circuits for Dynamic-Variation Tolerance

Year: 2008

Type: conference-paper

Source: Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference

DOI: 10.1109/isscc.2008.4523227

Authors: Keith A. Bowman, James W. Tschanz, Nam Sung Kim, Janice C. Lee, Chris B. Wilkerson, Shih-Lien L. Lu, Tanay Karnik, Vivek K. De

Institution: Intel (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1970806136

FWCI: 22.27

Cites: 7

Cited by: 85

Related to: 10