Work

Evaluation of Stress Effects on Electrical Characteristics of N-Type MOSFETs: Variations of DC Characteristics During the Resin-Molding Process

Year: 2010

Type: article

Source: Journal of Electronic Packaging

DOI: 10.1115/1.4000718

Authors: Masaaki Koganemaru, Toru Ikeda, Noriyuki Miyazaki, Hajime Tomokage

Institutions: Fukuoka Industrial Technology Center, Fukuoka Industrial Technology Center Machinery and Electronics Research Institute, Kyoto University, Fukuoka University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1974787699

FWCI: 1.43

Cites: 19

Cited by: 8

Related to: 10