Author

Hajime Tomokage

Observed names: H Tomokage, H. Tomokage, Hajime TOMOKAGE, Hajime Tomokage Hajime Tomokage, Tomokage Hajime

Observed institutions: Kyushu University, Kyoto University, Fukuoka University, Stanford University

OpenAlex ID: A5110056574

Fabrication of a single layer graphene by copper intercalation on a SiC(0001) surface

2014 · Kazuma Yagyu, Takayuki Tajiri, et al. · Applied Physics Letters · 53

Direct observation of electron emission site on boron-doped polycrystalline diamond thin films using an ultra-high-vacuum scanning tunneling microscope

1999 · Y. D. Kim, W. Choi, et al. · Applied Physics Letters · 49

Neutralization of an epitaxial graphene grown on a SiC(0001) by means of palladium intercalation

2017 · Kazuma Yagyu, Kazutoshi Takahashi, et al. · Applied Physics Letters · 29

Three States of Substitutional Gold in Silicon

1985 · Masami Morooka, Hajime Tomokage, et al. · Japanese Journal of Applied Physics · 29

The field emission properties of silicon carbide whiskers grown by CVD

2003 · Dong Chan Lim, Hyung Suk Ahn, et al. · Surface and Coatings Technology · 24

Cu-Cu direct bonding technology using ultrasonic vibration for flip-chip interconnection

2015 · Yoshiyuki Arai, Masatsugu Nimura, et al. · International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) · 17

Characterization of boron doped polycrystalline CVD diamond by ultra high vacuum scanning tunneling microscopy

2000 · Y.D Kim, W Choi, et al. · Diamond and Related Materials · 17

Influence of melt-temperature fluctuations on striation formation in large-scale Czochralski Si growth systems

1996 · Tadashi Kanda, Masataka Hourai, et al. · Journal of Crystal Growth · 17

Note on the Analysis of DLTS and C2-DLTS

1982 · Hajime Tomokage, Hiroshi Nakashima, et al. · Japanese Journal of Applied Physics · 15

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Solubilities of Undecanolide and Pentadecanolactone in Supercritical Carbon Dioxide

2000 · Kenji Mishima, Kiyoshi Matsuyama, et al. · Journal of Chemical & Engineering Data · 14

Energy Level and Solid Solubility of Cobalt in Silicon by In-Depth Profile Measurement

1984 · Hiroshi Nakashima, Hajime Tomokage, et al. · Japanese Journal of Applied Physics · 14

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Process Feasibility and Reliability Performance of Fine Pitch Si Bare Chip Embedded in Through Cavity of Substrate Core

2015 · Younggun Han, Osamu Horiuchi, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 13

Coating of pulp fiber with xonotlite under hydrothermal conditions

2002 · K. Takahashi, N. Yamasaki, et al. · Journal of Materials Science Letters · 13

Effect of Annealing Method upon Annealing Characteristics of Supersaturated Substitutional Gold in Silicon

1984 · Masami Morooka, Hajime Kitagawa, et al. · Japanese Journal of Applied Physics · 12

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Surface resistance and field emission current measurements on chemically vapour deposited polycrystalline diamond measured by scanning probe methods

2003 · Y Iseri, M Honda, et al. · Journal of Physics Condensed Matter · 11

Annealing of Supersaturated Low-Temperature Substitutional Gold in Silicon

1986 · Masami Morooka, Hajime Tomokage, et al. · Japanese Journal of Applied Physics · 11

A Modified Method of Isothermal Capacitance Transient Spectroscopy

1985 · Hajime Tomokage, Tokuo Miyamoto · Japanese Journal of Applied Physics · 11

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Evaluation of Residual Stress and Warpage of Device Embedded Substrates with Piezo-Resistive Sensor Silicon Chips

2015 · Younggun Han, Osamu Horiuchi, et al. · Transactions of The Japan Institute of Electronics Packaging · 10

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Experimental Study of Uniaxial-Stress Effects on DC Characteristics of nMOSFETs

2010 · Masaaki Koganemaru, Toru Ikeda, et al. · IEEE Transactions on Components and Packaging Technologies · 10

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Transient current measurements after applying the electron-beam pulse on boron-doped homoepitaxial diamond films

1998 · Hiroshi Sato, Hajime Tomokage, et al. · Diamond and Related Materials · 9

Method of determining capture cross section including a slow capture of carriers in the depletion edge region

1987 · H. Tomokage, T. Miyamoto, et al. · Journal of Applied Physics · 9

Effect of Direction of Ultrasonic Vibration on Flip-Chip Bonding

2013 · Mutsumi Masumoto, Yoshiyuki Arai, et al. · Transactions of The Japan Institute of Electronics Packaging · 8

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Evaluation of Stress Effects on Electrical Characteristics of N-Type MOSFETs: Variations of DC Characteristics During the Resin-Molding Process

2010 · Masaaki Koganemaru, Toru Ikeda, et al. · Journal of Electronic Packaging · 8

Determination of high-field-enhanced emission rates with the constant capacitance-voltage transient technique

1989 · M. B. Chang, H. Tomokage, et al. · Journal of Applied Physics · 8

Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer

2010 · Younggun Han, Masaaki Koganemaru, et al. · Applied Physics Letters · 7

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Works count: 117

Citation count: 563

H-index: 13

I10-index: 19