Work

Energy Level and Solid Solubility of Cobalt in Silicon by In-Depth Profile Measurement

Year: 1984

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.23.776

Authors: Hiroshi Nakashima, Hajime Tomokage, Hajime Kitagawa, Kimio Hashimoto

Institutions: Kyushu University, Fukuoka University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W1978236520

FWCI: 0.834

Cites: 3

Cited by: 14

Related to: 10