Work

Is strain engineering scalable in FinFET era?: Teaching the old dog some new tricks

Year: 2012

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.2012.6479065

Authors: Aneesh Nainani, Shashank Gupta, Victor Moroz, Munkang Choi, Yihwan Kim, Yonah Cho, Jerry Gelatos, Tushar Mandekar, Adam Brand, Er-Xuan. Ping, Mathew C. Abraham, Klaus Schuegraf

Institutions: Applied Materials (United States), Synopsys (United States)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1975768646

FWCI: 4.125

Cites: 5

Cited by: 37

Related to: 10