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Klaus K. Schuegraf
Observed names:
K K. Schuegraf,
K. K. Schuegraf,
K. Schuegraf,
K.K. Schuegraf,
Klaus Schuegraf
Institution:
Intel (United States)
Observed institutions:
University of Stuttgart,
Conexant (United States),
Intel (United States),
Applied Materials (United States),
Northrop Grumman (United States),
Cypress Semiconductor Corporation (United States),
Hughes Aircraft (United States),
Westinghouse Electric (United States)
show all 8
OpenAlex ID:
A5111805728
Handbook of thin-film deposition processes and techniques : principles, methods, equipment, and applications
1988
·
K. Schuegraf
·
Noyes Publications eBooks
·
149
Semiconductor Logic Technology Innovation to Achieve Sub-10 nm Manufacturing
2013
·
Klaus Schuegraf
, Mathew C. Abraham
, et al.
·
IEEE Journal of the Electron Devices Society
·
102
PDF
Ultra high speed SiGe NPN for advanced BiCMOS technology
2002
·
M. Racanelli
, K. Schuegraf
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
75
A 5.6MB/s 64Gb 4b/Cell NAND Flash memory in 43nm CMOS
2009
·
C. Trinh
, N. Shibata
, et al.
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
71
Transistor wars
2011
·
Khaled Ahmed
, Klaus Schuegraf
·
IEEE Spectrum
·
62
Deposition Technologies and Applications
2001
·
Werner Kern
, Klaus K. Schuegraf
·
Elsevier eBooks
·
44
Is strain engineering scalable in FinFET era?: Teaching the old dog some new tricks
2012
·
Aneesh Nainani
, Shashank Gupta
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
37
Memory grows up
2010
·
Agostino Pirovano
, Klaus Schuegraf
·
Nature Nanotechnology
·
32
$RC$ Performance Evaluation of Interconnect Architecture Options Beyond the 10-nm Logic Node
2014
·
Serkan Kincal
, Mathew C. Abraham
, et al.
·
IEEE Transactions on Electron Devices
·
21
BC35: a 0.35 μm, 30 GHz production RF BiCMOS technology
2003
·
M. Racanelli
, Zhe Zhang
, et al.
·
IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
·
17
0.18 μm SiGe BiCMOS technology for wireless and 40 Gb/s communication products
2002
·
K. Schuegraf
, M. Racanelli
, et al.
·
IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
·
16
Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology
2014
·
Sushant Mittal
, Shashank Gupta
, et al.
·
IEEE Transactions on Electron Devices
·
13
Oxide-isolated integrated injection logic
1974
·
R. Allen
, K. Schuegraf
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
9
Hermetically sealed silicon chip diodes and transistors
1962
·
J.L. Langdon
, W.E. Mutter
, et al.
·
IRE Transactions on Electron Devices
·
8
Semiconductor Manufacturing
2013
·
Rajendra Singh
, Luigi Colombo
, et al.
·
Wiley eBooks
·
7
Design Approach to Radiation-Hardened I2L Gate Arrays
1978
·
Ali Bahraman
, Stephen Chang
, et al.
·
IEEE Transactions on Nuclear Science
·
7
Epi defined (ED) FinFET: An alternate device architecture for high mobility Ge channel integration in PMOSFET
2013
·
S. Mittal
, S. Gupta
, et al.
·
IEEE International Nanoelectronics Conference
·
6
Radiation-Hardened Performance-Optimized I2L LSI
1977
·
A. Bahraman
, S. Chang
, et al.
·
IEEE Transactions on Nuclear Science
·
6
Epitaxialy defined (ED) FinFET: to reduce VT variability and enable multiple VT
2012
·
S. Mittal
, S. Gupta
, et al.
·
Conference digest
·
5
Schottky-base I/sup 2/L: a high-performance LSI technology
1979
·
A. Bahraman
, S.Y.S. Chang
, et al.
·
IEEE Journal of Solid-State Circuits
·
5
Hochreines Germanium – Oberflächenleitung und Trägerlebensdauer
1963
·
F. Aurich
, H. P. Kleinknecht
, et al.
·
Annalen der Physik
·
5
Radiation Effects on Bipolar Integrated Injection Logic
1975
·
J. P. Raymond
, T. Y. Wong
, et al.
·
IEEE Transactions on Nuclear Science
·
4
Photomask challenges for data-centric computing in the 2020s
2021
·
Klaus Schuegraf
·
Photomask and next-generation lithography mask technology. Conference
·
1
Textured AZO on silicon oxy-nitride barrier films for enhanced light trapping in micromorph tandem junction solar cells
2010
·
Yashraj Bhatnagar
, Brendan McComb
, et al.
·
Conference record of the IEEE Photovoltaic Specialists Conference
·
1
Single-wafer process technology: enabling rapid SiGe BiCMOS development
2003
·
K. Schuegraf
·
IEEE Transactions on Semiconductor Manufacturing
·
1
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Works count:
36
Citation count:
706
H-index:
12
I10-index:
12
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