Work

Radiation-Hardened Performance-Optimized I2L LSI

Year: 1977

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.1977.4329215

Authors: A. Bahraman, S. Chang, D. Romeo, K. Schuegraf, T. Wong

Institution: Northrop Grumman (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2016282906

FWCI: 3.178

Cites: 10

Cited by: 6

Related to: 10