Proposed UV-laser-source-excited high-resolution and high-count-rate time-of-flight photoelectron energy analyzer for solid state samples
Year: 1994
Type: conference-paper
DOI: 10.1117/12.186603
Institution: Institute of Physics
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1978719975
