Work

Third generation FPA development status at Raytheon Vision Systems (Invited Paper)

Year: 2005

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.609494

Authors: W. A. Radford, E. A. Patten, D. F. King, G. K. Pierce, J. Vodicka, P. Goetz, G. Venzor, E. P. Smith, R. Graham, S. M. Johnson, J. Roth, B. Nosho, J. Jensen

Institutions: RTX (United States), Raytheon (United States), HRL Laboratories (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978960694

FWCI: 8.443

Cites: 6

Cited by: 42

Related to: 10