Author

Brett Z. Nosho

Observed names: B NOSHO, B. Nosho, B. Z. Nosho, B.Z Nosho, B.Z. Nosho, Brett Nosho
OpenAlex ID: A5000732917
1995 · V. Bressler-Hill, S. Varma, et al. · Physical Review Letters · 122
2004 · E. P. G. Smith, L. T. Pham, et al. · Journal of Electronic Materials · 76
2000 · W. Barvosa-Carter, A. S. Bracker, et al. · Physical Review Letters · 69
2002 · B.Z Nosho, B.R Bennett, et al. · Journal of Crystal Growth · 45
2001 · B. Z. Nosho, B. R. Bennett, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 45
2006 · E. P. G. Smith, E. A. Patten, et al. · Journal of Electronic Materials · 43
2005 · W. A. Radford, E. A. Patten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 42
2017 · Pierre-Yves Delaunay, Brett Z. Nosho, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 40
1999 · B. Z. Nosho, W. H. Weinberg, et al. · Applied Physics Letters · 40
1992 · T. P. Pearsall, Jeff C. Adams, et al. · Journal of Applied Physics · 24
2006 · D. F. King, W. A. Radford, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 23
1998 · B. Z. Nosho, W. H. Weinberg, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 23
1992 · J. N. Kidder, P. S. Williams, et al. · Applied Physics Letters · 22
2002 · B. Z. Nosho, B. R. Bennett, et al. · Applied Physics Letters · 21
2006 · E. P. G. Smith, R. E. Bornfreund, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 19
2003 · S. G. Kim, S. C. Erwin, et al. · Physical review. B, Condensed matter · 19
1999 · B. Z. Nosho, W. H. Weinberg, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 19
1999 · Benjamin V. Shanabrook, W. Barvosa-Carter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 18
2001 · R. Magno, A. S. Bracker, et al. · Journal of Applied Physics · 16
2004 · R. A. Coussa, A. M. Gallagher, et al. · Journal of Electronic Materials · 15
1992 · T.P. Pearsall, Jeff C. Adams, et al. · Thin Solid Films · 15
2003 · Edward P. Smith, Le T. Pham, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
2002 · D. W. Stokes, R. L. Forrest, et al. · Journal of Applied Physics · 14
Works count: 58
Citation count: 1,037
H-index: 19
I10-index: 30
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