Work

HCI/BTI coupled model: The path for accurate and predictive reliability simulations

Year: 2014

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2014.6860673

Authors: F. Cacho, P. Mora, W. Arfaoui, X. Federspiel, V. Huard

Institution: STMicroelectronics (France)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1982281828

FWCI: 6.825

Cites: 9

Cited by: 30

Related to: 10