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Angle and wavelength resolved light scattering measurement of optical surfaces and thin films

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Year: 2013
Type: conference-paper
Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
DOI: 10.1117/12.2024144
Authors: Sven Schröder, David Unglaub, Alexander von Finck, Matthias Hauptvogel, Marcus Trost, Tobias Herffurth, Angela Duparré, John C. Stover
Institutions: Fraunhofer Institute for Applied Optics and Precision Engineering, The Scatter Works (United States)
Language: English

Topic: Surface Roughness and Optical Measurements
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: European Regional Development Fund
OpenAlex ID: W1982940783
FWCI: 1.245
Cites:
Cited by: 7
Related to: 10
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