Work

The efficacy of error mitigation techniques for DRAM retention failures

Year: 2014

Type: conference-paper

Source: ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems (SIGMETRICS)

DOI: 10.1145/2591971.2592000

Authors: Samira Khan, Donghyuk Lee, Yoongu Kim, Alaa R. Alameldeen, Chris Wilkerson, Onur Mutlu

Institutions: Intel (United States), Carnegie Mellon University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Division of Computing and Communication Foundations, Division of Computer and Network Systems

Awards: G1483756159, G4605205779

OpenAlex ID: W1983178358

FWCI: 14.28

Cites: 56

Cited by: 158

Related to: 10