Work

Physical properties of sputtered amorphous Ge: The role of the deposition rate

Year: 1972

Type: article

Source: Czechoslovak Journal of Physics

DOI: 10.1007/bf01689909

Authors: S. Koc, O. Renner, M. Závětová, J. Zemek

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1983270362

FWCI: 3.029

Cites: 21

Cited by: 19

Related to: 10