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Joseph Zemek

Demonstration of molecular beam epitaxy and a semiconducting band structure for I-Mn-V compounds
2011 · T. Jungwirth, V. Novák, et al. · Physical Review B · 64
Metal doped polymer films prepared by simultaneous plasma polymerization of tetrafluoromethane and evaporation of gold
1985 · L Martinů, H Biederman, et al. · Vacuum · 53
Angular-resolved photoelectron spectroscopy of corrugated surfaces
2005 · K. Olejnik, J. Zemek, et al. · Surface Science · 40
Density of amorphous silicon films
1973 · O. Renner, J. Zemek · Czechoslovak Journal of Physics · 35
The response of tin acetylacetonate and tin dioxide-based gas sensors to hydrogen and alcohol vapours
2000 · M Vrňata, V Myslı́k, et al. · Sensors and Actuators B Chemical · 34
Laser reactive ablation deposition of silicon-nitride films
1995 · M. L. Giorgi, G. Leggieri, et al. · Applied Physics A · 34
Electrical and optical properties of annealed amorphous Ge
1972 · S. Koc, M. Závětová, et al. · Thin Solid Films · 24
Escape probability of s-photoelectrons leaving aluminium and copper oxides
1998 · J. Zemek, S. Hucek, et al. · Surface and Interface Analysis · 23
Steep vs. exponential absorption edge in amorphous germanium: Evidence for the efefct of oxygen
1972 · M. Závětová, S. Koc, et al. · Czechoslovak Journal of Physics · 22
Angle-resolved elastic peak electron spectroscopy: Role of surface excitations
2007 · A. Jablonski, J. Zemek · Surface Science · 20
Physical properties of sputtered amorphous Ge: The role of the deposition rate
1972 · S. Koc, O. Renner, et al. · Czechoslovak Journal of Physics · 19
On the role of hydrogen in a-Si
1980 · J. Zemek, M. Závětová, et al. · Journal of Non-Crystalline Solids · 17
Composite metal/C:H films prepared in an unbalanced magnetron
1997 · H. Biederman, R.P. Howson, et al. · Vacuum · 14
Photoelectron and infrared spectroscopy of semi-insulating silicon layers
1997 · M. Trchová, J. Zemek, et al. · Journal of Applied Physics · 13
DC conductivity of amorphous germanium
1975 · V. Čápek, S. Koc, et al. · Journal of Non-Crystalline Solids · 13
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
2002 · P. Jiricek, J. Zemek, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 12
Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers
1999 · B Lesiak, A Kosinski, et al. · Applied Surface Science · 12
Experiments to determine the escape probability of photoelectrons
1999 · J. Zemek, S. Hucek · Fresenius Journal of Analytical Chemistry · 12
Carbon and composite carbon-metal films deposited in an rf glow discharge operated in organic gases
1985 · H Biederman, L Martinů, et al. · Vacuum · 12
Luminescence as a tool for crosslinking determination in plasma polysilylenes prepared from organosilanes
2000 · F. Schauer, S. Nešpu̇rek, et al. · Synthetic Metals · 11
SEARCH FOR Fe4+ IN YIG : Ca GARNET FILMS
1988 · Z. Šimša, Šimšová, et al. · Le Journal de Physique Colloques · 10
Deposition of magnetic thin films by IBAD
1999 · T Šikola, J Spousta, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 8
Direct nitridation of a silicon surface by multipulse excimer laser irradiation in a nitrogen-containing ambient gas
1991 · I. N. Mihailescu, V. Craciun, et al. · Journal of Applied Physics · 7
Doping of amorphous silicon by ion implantation: Electrical, optical and photoelectrical properties
1981 · M. Závětová, J. Zemek, et al. · Czechoslovak Journal of Physics · 6
UV degradability of polysilanes for nanoresists examined by electron spectroscopies and photoluminescence
2006 · I. Kuritka, F. Schauer, et al. · Czechoslovak Journal of Physics · 5
Works count: 51
Citation count: 560
H-index: 13
I10-index: 21
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