Work

Optical properties of silicon and its oxides

Year: 1993

Type: article

Source: Journal of the Optical Society of America B

DOI: 10.1364/josab.10.000952

Authors: C. Tarrio, S. E. Schnatterly

Institution: University of Virginia

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1987508802

FWCI: 0.663

Cites: 39

Cited by: 43

Related to: 10