Work

High reliability level on single-mode 980nm-1060 nm diode lasers for telecommunication and industrial applications

Year: 2008

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.762943

Authors: J. Van de Casteele, M. Bettiati, F. Laruelle, V. Cargemel, P. Pagnod-Rossiaux, P. Garabedian, L. Raymond, D. Laffitte, S. Fromy, D. Chambonnet, J. P. Hirtz

Institution: 3S Photonics (France)

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1990658198

FWCI: 3.791

Cites: 2

Cited by: 27

Related to: 10