Work

Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization

Year: 2007

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927607079020

Authors: M Watanabe, H Hojo, D Ackland, C Kiely, D Williams

Institutions: Lehigh University, Kyoto University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W1990809876

FWCI:

Cites:

Cited by:

Related to: 10