Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
David W. Ackland
Observed names:
D Ackland,
D W Ackland,
D. Ackland,
D. W. ACKLAND,
D. W. Ackland,
D.W. Ackland,
David W Ackland
show all 7
Institution:
Lehigh University
Observed institution:
Lehigh University
OpenAlex ID:
A5082075619
Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction
2006
·
M. Watanabe
, D.W. Ackland
, et al.
·
Microscopy and Microanalysis
·
71
High‐performance X‐ray detection in a new analytical electron microscope
1994
·
C. E. LYMAN
, J. I. GOLDSTEIN
, et al.
·
Journal of Microscopy
·
60
Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM
2007
·
M Watanabe
, M Kanno
, et al.
·
Microscopy and Microanalysis
·
23
First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM
2004
·
Lawrence F Allard
, Douglas A Blom
, et al.
·
Microscopy and Microanalysis
·
5
PDF
Identification of nano-precipitates in a ferritic alloy steel using secondary electron STEM imaging
2001
·
Jesse G Nawrocki
, John N DuPont
, et al.
·
Scripta Materialia
·
4
Advantages of Cs-correctors for Spectrometry in STEM
2005
·
M Watanabe
, D W Ackland
, et al.
·
Microscopy and Microanalysis
·
3
PDF
Improve X-ray Microanalysis in Variable-Pressure SEMs with Polycapillary X-ray Optics
2005
·
N Gao
, B Gallagher
, et al.
·
Microscopy and Microanalysis
·
2
PDF
Effect of rapid quenching on Sb grain-boundary segregation in Cu
2003
·
Chunfei Li
, Masashi Watanabe
, et al.
·
Materials Letters
·
2
Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope
2008
·
M Watanabe
, M Kanno
, et al.
·
Microscopy and Microanalysis
·
1
Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage FEG-STEM
1997
·
M Watanabe
, D W Ackland
, et al.
·
Microscopy and Microanalysis
·
1
The standard hole-count test: A progress report
1991
·
C. E. Lyman
, D. W. Ackland
·
Proceedings annual meeting Electron Microscopy Society of America
·
1
Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization
2007
·
M Watanabe
, H Hojo
, et al.
·
Microscopy and Microanalysis
Quantification of X-ray Spectrum Images in the Analytical Electron Microscope: Progress Toward Single-Atom-Detection Limits
2007
·
D Williams
, D Ackland
, et al.
·
Microscopy and Microanalysis
Sb Grain Boundary Segregation in Rapidly Solidified Cu-Sb Alloy
2002
·
Chunfei Li
, Masashi Watanabe
, et al.
·
Microscopy and Microanalysis
PDF
Interface analysis in the VG microscopes’ HB603 300 keV STEM
1995
·
John Bruley
, David W. Ackland
, et al.
·
Proceedings annual meeting Electron Microscopy Society of America
X-ray detection performance of a 300KV field-emission Analytical Electron Microscope
1993
·
C. E. Lyman
, J. I. Goldstein
, et al.
·
Proceedings annual meeting Electron Microscopy Society of America
The Hole-Count Test Revisited: Effects of Test Specimen Thickness
1989
·
Charles E. Lyman
, D Ackland
, et al.
·
NASA Technical Reports Server (NASA)
空孔の計測の再検討 測定試料の厚みの影響(分析電子顕微鏡)
1989
·
C E Lyman
, D W Ackland
, et al.
Show more works
View as search
Works count:
18
Citation count:
173
H-index:
4
I10-index:
3
Year
Topic
Type
