Work

Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction

Year: 2006

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927606060703

Authors: M. Watanabe, D.W. Ackland, A. Burrows, C.J. Kiely, D.B. Williams, O.L. Krivanek, N. Dellby, M.F. Murfitt, Z. Szilagyi

Institutions: Lehigh University, Nion (United States)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2030708643

FWCI: 2.621

Cites: 43

Cited by: 71

Related to: 10