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X-ray detection performance of a 300KV field-emission Analytical Electron Microscope

Year: 1993

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100147090

Authors: C. E. Lyman, J. I. Goldstein, D.B. Williams, D.W. Ackland, S. von Harrach, A. W. Nicholls, P.J. Statham

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3035848764

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Cites: 1

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