Limits of the successive breakdown statistics to assess chip reliability
Year: 2004
Type: article
Source: Microelectronic Engineering
Authors: Jordi Suñé, Ernest Y. Wu, Wing L. Lai
Institutions: Universitat Autònoma de Barcelona, IBM (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1993379956