Work

Electron microscopic investigation of MnSi1.7 layers on Si(001)

Year: 2002

Type: article

Source: Microelectronic Engineering

DOI: 10.1016/s0167-9317(01)00601-3

Authors: A Mogilatenko, M Falke, S Teichert, S Schwendler, D.K Sarkar, H.-J Hinneberg

Institution: Chemnitz University of Technology

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1995635169

FWCI: 1.31

Cites: 7

Cited by: 17

Related to: 10