Work

Test data compression strategy while using hybrid-BIST methodology

Year: 2013

Type: conference-paper

Source: IEEE East-West Design & Test Symposium (EWDTS)

DOI: 10.1109/ewdts.2013.6673168

Authors: E. Karimi, M. Tabandeh, M.H. Haghbayan

Institutions: Sharif University of Technology, University of Tehran

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1997671820

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Cites: 7

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Related to: 10